2023-07-12 17:24:44
JEOL Ltd. (TOKYO:6951) (President and CEO, Izumi Oi) announced the launch, scheduled for July 23, 2023, of the JSM-IT710HR/JSM-IT210 Scanning Electron Microscope.
news-body-cta">This press release includes multimedia. See the full statement here:
JSM-IT710HR (Photo: Business Wire)
Scanning electron microscopes (SEM) are used for a variety of purposes – from basic research, production lines and quality assurance to research and development – and their fields of application include metals, semiconductors, batteries, biotechnology and polymers. There is a growing need for easier confirmation of compositional data, taking into account not only observation but also analysis.
The JSM-IT710HR has improved electron gun stability, while the JSM-IT210 employs sample control stage with 5-axis motor drive. Both models have enhanced automatic measurement functions for observation and analysis and significantly enhance the strengths of the SEM. These models will meet the current needs of the automatic measurement market and contribute to increasing efficiency in routine jobs.
Main features
1. “Simple SEM” automates SEM image acquisition and EDS analysis
The Simple SEM function allows the user to select the acquisition conditions and field of view for the SEM image, and then the SEM image and EDS (Energy Dispersive X-Ray Spectroscopy) analysis are acquired automatically. This will help to increase efficiency in routine work, including analyses.
2. “Live3D” creates 3D images on the fly
3D images can be created while the SEM observation is being carried out, thus obtaining irregularity and depth information.
3. “Stage Navigation System LS” allows acquiring an optical image of an area five times larger than that of conventional systems
The Stage Navigation System LS can acquire an optical image of an area five times larger than that of conventional systems (diameter approx. 159 mm). This function allows the user to acquire an optical image of the observation sample and move to the desired observation field simply by clicking on the optical image.
4. “Low-vacuum Hybrid Secondary Electron Detector (LHSED)” acquires improved topographic information even under low vacuum
This detector collects electron and photon signals, providing a high S/N image and improved topographical information, even under low vacuum.
5. 5-axis motor drive control sample stage
The 5-axis motor control sample stage is employed as standard, making it more convenient to perform SEM imaging of irregular samples and EDS analysis.
6. Improved electron gun stability (JSM-IT710HR)
Electron beam stability has been improved, making automatic and continuous operation possible over a long period of time using a sample holder capable of loading multiple samples at once.
Annual unit sales target
JSM-IT710HR: 150 units/year
JSM-IT210: 250 units/year
JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, president and CEO
(stock code: 6951, Tokyo Stock Exchange Main Market)
The original language text of this announcement is the official authorized version. Translations are provided as a convenience only and must refer to the original language text, which is the only version of the text that is legally binding.
View the original version on businesswire.com:
Contact:
JEOL Ltd.
Scientific and Measuring Instruments Sales Division
TEL: +81-3-6262-3575
Source: BUSINESS WIRE
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